Measuring system composed of digital controlled light source (xenon lamp XBO150, monochromator, set of edge filters, shutter, system of light intensity stabilization), calibrated photodiode, dedicated potentiostat and Kelvin Probe with oscillating gold mesh probe electrode.
Device enabling on registration of photocurrent action maps in wide range of exciting wavelength and working electrode potential as well as on measurement of work function as a function of wavelength of incident light. System can be used for characterization of broad-band semiconductors, especially enabling on registration of three-dimensional (at modulated electrode potential – incident light wavelength range) maps of photocurrents generated by semiconductor as well as indirectly on determination of type of conductivity, bandgap width as well as quantum efficiency of light conversion.
Work Parameters |
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Wavelength range: 200 - 1000 nm |
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WE polarization range: ±2 V |
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Sensitivity of photovoltage detector <1 mV |
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Accuracy of probing electrode location 5 µm |
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Low Noise preamplifier of sensitivity better than 0.1 mV |
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Low Noise phase-sensitive detector (lock-in) |
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Analog control of amplification and time of signal integration |
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Tunable band-pass filter |
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Analog signal output |
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Automatic correction of signal phase |
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Manual and automatic compensation of contact potential |
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Calibrated contact potential output |
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Continuous registration of work function changes |
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Resolution better than 1 meV |
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Dynamic range 10 V |
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Self-tunable resonator’s circuit, oscillation frequency of ca.180 Hz |
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Tunable oscillation amplitude.1 - 2.0 mm |
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Measuring system installed at optical table and located in dark Faraday’s cadge |
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Piezoelectric servo-motor enabling precise location of probing electrode |
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Analog/digital conveter with data storage system 16 bit digital/Analog converter of range ± 5 V |
Contact persons
prof. dr hab. Konrad Szaciłowski, mgr Andrzej Blachecki
