Research profile

Current research undertaken by the Electron Microscopy and Structural Research Group focuses on application of X-ray diffraction and electron microscopy techniques to a wide range of materials and devices, in order to obtain detailed structural information on the micrometer and sub-micrometer scale. Techniques such as X-ray reflectometry (XRR), grazing incidence X-ray diffraction (GIXD), electron diffraction (in particular electron backscattered diffraction - EBSD, selected area electron diffraction - SAED), energy dispersive X-ray spectroscopy (EDXS) are employed to materials investigation and particular emphasis is being placed on understanding of structure-property relations of materials.

Our recent projects include: investigation of polycrystalline materials properties by multi-reflection grazing-incidence X-ray diffraction method (MGIXD), phase analysis of sintered high entropy alloys, morphological characterization of nano-porous ceramics (CaO-Al2O3), TEM analysis of structural changes in electrode materials for lithium-ion batteries, microstructural characterization of in situ Fe/TiC composites.

Fields of expertise


  • Qualitative and quantitative phase analysis, determination of crystallite size and degree of crystallinity of investigated material
  • Crystallographic texture determination and residual stress measurements
  • Determination of the residual stress and lattice constants depth-dependent profile in the surface region of the polycrystalline materials and thin layers
  • X-ray diffraction stress determination and X-ray elastic constants measurements in samples under external load ( in situ)
  • XRR measurements of thin films in parallel beam configuration (thickness determination, analysis of morphology, supramolecular structure and structural anisotropy investigation)


  • Investigation of the temperature dependent phase transitions 


  • Morphological and topographical characterization of metals and alloys, ceramics, polymers, geological samples and also wet and biological specimens
  • Particle  size and shape determination, analysis of surface porosity and structural defects
  • Analysis of crystallographic orientation using Electron Backscatter Diffraction (EBSD) technique
  • Phase identification, texture measurements and Orientation Distribution Function (ODF)


  • Qualitative and quantitative analysis of chemical composition of materials using energy dispersive X-ray spectrometry (point/line measurements, maps)


  • Analysis of grain/crystallite/particle size,  mono-/multi- layers thickness determination, analysis of size and distribution of precipitates
  • Phase identification in micro-/nano- areas, local crystallographic orientation analysis, determination of crystallographic orientation relations between phases.

Head of the group

  • prof. dr. hab. Marek Przybylski


  • Dr inż. Katarzyna Berent
  • Dr inż. Marta Gajewska
  • Dr inż. Marianna Marciszko