Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

M. Marciszko, A. Baczmański, C. Braham, M. Wróbel, S. Wroński, G. Cios
Acta Materialia 123, 157-166 (2017)
tekst: http://dx.doi.org/10.1016/j.actamat.2016.10.029