TEM Study of Schottky Junctions in Reconfigurable Silicon Nanowire Devices

S. Banerjee, M. Löffler, U. Muehle, K. Berent, W. Weber, E. Zschech
Advanced Engineering Materials 18, 180-184 (2016)
tekst: http://dx.doi.org/10.1002/adem.201400577