XPS depth profiling of organic photodetectors with the gas cluster ion beam

J. Haberko, M. M. Marzec, A. Bernasik, W. Łużny, P. Lienhard, A. Pereira, J. Faure-Vincent, D. Djurado and A. Revaux
Journal of Vacuum Science & Technology B 34, 03H119 (2016)
tekst: http://dx.doi.org/10.1116/1.4943028