A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction

M. Marciszko, A. Baczmański, M. Klaus, C. Genzel, A. Oponowicz, S. Wroński, M. Wróbel, C. Braham, H. Sidhom, R. Wawszczak

Journal of Applied Crystallography 51, 732–745 (2018)

tekst: https://doi.org/10.1107/S1600576718004193