Magnetic Contrast at Spin-Flip Excitations: An Advanced X-Ray Spectroscopy Tool to Study Magnetic-Ordering

H. Elnaggar, R.-P. Wang, S. Lafuerza, E. Paris, Y. Tseng, D. McNally, A. Komarek, M. Haverkort, M. Sikora, T. Schmitt, and F.M.F. de Groot
ACS Appl. Mater. Interfaces 11, 36213 (2019)
tekst: https://doi.org/10.1021/acsami.9b10196