Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

G. Cios, G. Nolze, A. Winkelmann, T. Tokarski, R. Hielscher, R. Strzałka, I. Bugański, J. Wolny, P. Bała
Ultramicroscopy, 218, 113093 (2020)
tekst: https://doi.org/10.1016/j.ultramic.2020.113093
linia badawcza: III