Improving EBSD precision by orientation refinement with full pattern matching

A. Winkelmann, B.M. Jablon, V.S. Tong, C. Trager-Cowan, K.P. Mingard
Journal of Microscopy 277, 79 (2020)
tekst: https://doi.org/10.1111/jmi.12870
linia badawcza: III