Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P.R. Edwards, G. Ferenczi, B. Hourahine, A. Kotzai, S. Kraeusel, G. Kusch, R.W. Martin, R. McDermott, N. Gunasekar, M. Nouf-Allehiani, E. Pascal, D. Thomson, S. Vespucci, M.D. Smith, P.J. Parbrook, J. Enslin, F. Mehnke, C. Kuhn, T. Wernicke, M. Kneissl, S. Hagedorn, A. Knauer, S. Walde, M. Weyers, P.-M. Coulon, P. Shields, J. Bai, Y. Gong, L. Jiu, Y. Zhang, R. Smith, T. Wang, A. Winkelmann
Semiconductor Science and Technology 35, 054001 (2020)
tekst: https://doi.org/10.1088/1361-6641/ab75a5
linia badawcza: III