- Vibrating Sample Magnetometer (VSM) equipped with magnetoresistance option
- HB05 bonder equipped with optical microscope and heating stage
- Four-point probe measurement system for thin layers in external magnetic field
- Four-point probe measurement system for nanowires
supervisors: dr hab. inż. Marcin Sikora, prof AGH, mgr inż. Juliusz Kuciakowski
tel: +48 12 617 52 45
room no.: 0.14.0