- Optical microscope NIKON ECLIPSE LV150N
- System of two nanomanipulators miBots of IMINa for scanning electron microscope
- Quorum Technologies Q150T E turbo- pumped sputter coater
- Scanning Electron Microscope – FEI VERSA 3D
- Plasma Cleaner PDC-32G-2
- Argon ion milling system for samples flat milling or cross-section preparation
supervisor: dr inż. Katarzyna Berent
tel: +48 12 617 52 76
tel: +48 12 617 52 81
room no.: 0.04.0