- Transmission electron microscope Tecnai TF 20 X-TWIN (FEI)
- Scanning electron microscope SEM/FIB Quanta 3D 200i (FEI)
- Nanoindenter G200 by AGILENT
- TRB3 Anton Paar tribometer
supervisor: dr inż. Marta Gajewska
tel: +48 12 617 52 62
tel: +48 12 617 52 63
room no.: 0.03.0