KRAKOW CONDENSED MATTER SEMINAR and ACMiN Seminar: „Introduction into spectroscopic ellipsometry – Complex sample analysis in a wide spectral range from DUV to NIR”
This semester, the seminar so far organized by the Academic Center of Materials and Nanotechnology will be combined with the Krakow Condensed Matter Seminar. The day and time of the seminars are changed from Thursday 2 pm to Wednesday 9 am.
It is our pleasure to invite you to attend the KRAKOW CONDENSED MATTER SEMINAR and the ACMiN Seminar which will be held on Wednesday, June 14 at 9.00 a.m. in the ACMiN auditorium no.: 1.02A, on the second floor, bldg. D-16 (Kawiory Street 30). Those who cannot be present at ACMiN on that day are invited to join the seminar on-line, on the Teams platform, at the following link:
The lecture entitled „Introduction into spectroscopic ellipsometry – Complex sample analysis in a wide spectral range from DUV to NIR” will be presented by dr Sven Peters.
Abstract:
Ellipsometry is a contactless, nondestructive, widely used optical measurement technique for the determination of thickness and optical constants (refractive index n and extinction coefficient κ) of materials of substrates or in layer stacks. It is used as well in research and industrial quality control. An introduction into the theory of this versatile method and ellipsometric workflow will be given as well as a presentation of selected applications. These applications cover a range from simple single film applications to complex multilayer material analysis from the DUV to NIR spectral range. Also temperature dependent measurements, a combination of ellipsometry with complementary techniques and spatial resolved measurements will be shown.
