Wydarzenia

This study introduces advanced multi-reflection X-ray diffraction techniques, including MGIXD and MMXD, for non-destructive, depth-resolved analysis of residual stresses in polycrystalline materials.

By using multiple diffraction peaks and combining angle- and energy-dispersive methods, precise characterization of stress gradients near surfaces up to several micrometers deep can be performed. The methodologies enhance depth profiling accuracy, account for elastic anisotropy, and provide new insights into the stress states in materials such as tungsten and steel, supporting improved material performance and reliability in engineering applications.